Aehr Test Systems Announces

Tag : Power Logic

"This ABTS system is the first in a series that will be introducedover the next several quarters for testing packaged devices. Thisnew technology is based on our successful FOX(TM)-1 full-wafercontact burn-in and test system," said Greg Perkins, vice presidentof worldwide sales and service at Aehr Test Systems. "Other membersof the ABTS family will focus on high-power logic and memorydevices."
"We are always committed in providing the most competitive solutionto our customers, and ABTS is a powerful extension of thatcommitment," said Christine Lee, Manager of Corporate Communication& Industrial Competitiveness Planning Division of IntegratedService Technology. "By working with Aehr, we are able to achieveour customers' best satisfaction."
"We understand the needs of customers for their burning-in andtesting of advanced logic devices," commented Rick Wu, VP ofIntegrated Engineering Service Division of Integrated ServiceTechnology. "Therefore, we dedicate our knowledge and services tohelp customers successfully compete in their market space."
The ABTS family of products is based on a completely new hardwareand software architecture that addresses not only today's devices,but also future devices for many years to come. It can test andburn-in memory as well as both high-power logic and low-powerlogic. It can be configured to provide individual devicetemperature control for devices up to 50W or more and with up to320 I/O channels.
About Integrated Service Technology
Integrated Service Technology is one of the largest ReliabilityEngineering, IC Failure Analysis and Integration Project Servicecompanies in the Asia-Pacific region, and it also has a significantpresence in other world-wide markets. The company's broadintegration project service portfolio includes developing leadingtesting, verification, evaluation, debugging, and analysis projectservice technologies: mastering advanced semiconductornano-processes, protecting intellectual property and greenenvironmental trends that combine electrical parameter analysis,reliability engineering and other technologies to provide the mosttimely high quality comprehensive service, accelerating customerproduct development and time to market plan. Headquartered inTaiwan, Integrated Service Technology has service and supportoffices around the world, including the U.S., Japan, and China.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is aleading worldwide provider of systems for burning-in and testingmemory and logic integrated circuits and has an installed base ofmore than 2,500 systems worldwide. Aehr Test has developed andintroduced several innovative products, including the ABTS, FOX,MTX and MAX systems and the DiePak(R) carrier. The FOX system is afull wafer contact test and burn-in system. The MTX system is amassively parallel test system designed to reduce the cost ofmemory testing by performing both test and burn-in on thousands ofdevices simultaneously. The MAX system can effectively burn-in andfunctionally test complex devices, such as digital signalprocessors, microprocessors, microcontrollers andsystems-on-a-chip. The DiePak carrier is a reusable, temporarypackage that enables IC manufacturers to perform cost-effectivefinal test and burn-in of bare die.
Safe Harbor Statement
This release contains forward-looking statements that involve risksand uncertainties relating to projections regarding customer demandand acceptance of Aehr Test's products. Actual results may varyfrom projected results. These risks and uncertainties include,without limitation, acceptance by customers of the ABTS technology,acceptance by customers of the ABTS systems shipped upon receipt ofa purchase order and the ability of new products to meet customerneeds or perform as described. See Aehr Test's recent 10-K, 10-Qand other reports from time to time filed with the Securities andExchange Commission (SEC) for a more detailed description of therisks facing our business. The Company disclaims any obligation toupdate information contained in any forward-looking statement toreflect events or circumstances occurring after the date of thispress release.